- published: 30 Apr 2013
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The atom probe was introduced at the 14th International Field Emission Symposium in 1967 by Erwin Wilhelm Müller and J. A. Panitz. It combined a field ion microscope with a mass spectrometer having a single particle detection capability and, for the first time, an instrument could “... determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”.
Atom probes are unlike conventional optical or electron microscopes, in that the magnification effect comes from the magnification provided by a highly curved electric field, rather than by the manipulation of radiation paths. The method is destructive in nature removing ions from a sample surface in order to image and identify them, generating magnifications sufficient to observe individual atoms as they are removed from the sample surface. Through coupling of this magnification method with time of flight mass spectrometry, ions evaporated by application of electric pulses can have their mass-to-charge ratio computed.
An atom is the smallest constituent unit of ordinary matter that has the properties of a chemical element. Every solid, liquid, gas, and plasma is composed of neutral or ionized atoms. Atoms are very small; typical sizes are around 100 pm (a ten-billionth of a meter, in the short scale). However, atoms do not have well-defined boundaries, and there are different ways to define their size that give different but close values.
Atoms are small enough that classical physics gives noticeably incorrect results. Through the development of physics, atomic models have incorporated quantum principles to better explain and predict the behavior.
Every atom is composed of a nucleus and one or more electrons bound to the nucleus. The nucleus is made of one or more protons and typically a similar number of neutrons (none in hydrogen-1). Protons and neutrons are called nucleons. More than 99.94% of an atom's mass is in the nucleus. The protons have a positive electric charge, the electrons have a negative electric charge, and the neutrons have no electric charge. If the number of protons and electrons are equal, that atom is electrically neutral. If an atom has more or fewer electrons than protons, then it has an overall negative or positive charge, respectively, and it is called an ion.
To learn more, visit http://www.sydney.edu.au/acmm
This film was realized by CNRS image and Résitech HN and presents history of this instrument and its local envirronment The atom probe is a microscope with three-dimensional, sub-nanometer spatial resolution used in material science that was introduced at the 14th Field Emission Symposium in 1967 by Erwin Müller and John Panitz. For the first time an instrument could “... determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”. Erwin Wilhelm Müller, J. A. Panitz, and S. Brooks McLane.[1] The atom probe is closely related to the field ion microscope, the first microscopic instrument capable of atomic resolution, developed in 1951 by Erwin Wilhelm Müller.[2] Atom probes are unlike conventional optical or electro...
Basic principle of atom probe tomography, a unique 3D nanoscale characterization tool for materials. Environmental Molecular Sciences Laboratory (EMSL) Shared on Google+ · 10 months ago One of the ways scientists can analyze energy, environmental and biological materials is with atom probe tomography, or APT. This short animation shows the basic principles of APT. EMSL Scientist Arun Devaraj developed the video and it was featured in the cover story of the Oct. 13, 2013 issue of C&EN;.
Speaker: David N. Seidman (MSE, NU) "The workshop on Semiconductors, Electronic Materials, Thin Films and Photonic Materials" Tel Aviv University February 22-25, 2015
A brief overview of Atom Probe Tomography and its Computational Model by Timothy Chan and Yuxiang Zhang. Thanks to the Marquis research group, the University of Michigan Materials Science and Engineering department, the Electron Microbeam Analysis Laboratory, and the 2015 SURE program.
This video is about atom_probe_PLO, including the entire process from initial sample to final atom probe tips. Watch my webpage (www.peterfelfer.org) for updates on sample preparation and analysis methods for atom probe. If you found this useful, you can find more background information in my paper: A reproducible method for damage-free site specific preparation of atom probe tips by means of FIB lift-out and TEM, P. J. Felfer, T Alam, S.P. Ringer and J.M. Cairney, Microscopy Research and Technique 75 (2012) 484-491. http://dx.doi.org/10.1002/jemt.21081
An Iowa State University College of Engineering student tells us more about the Atom Probe Microscope on campus, and about the advantage this opportunity has given him.
This is Pt. 1 of a series of seminars on the use of open source software for atom probe analysis. Pt. 2 will be on interface analysis and happen in a few weeks from now. Pt1: Blender Basics overview of blender Importing atom probe data Visualisation Animation basics
Atom Probe Microscope at Iowa State University
SURE 2012: Atom Probe Tomography of Vitreous Ice - Adam McFarland Work partially supported by the National Science Foundation, Grant No. DMR-1201436
A brief introduction to the EDAX Atom Probe Assist software module, given by EBSD product manager, Matt Nowell.
An Atom Probe Tomography reconstruction - find out more at http://www.materialstoday.com/characterization/features/site-occupancy-via-atom-probe-microscopy/
To learn more, visit http://www.sydney.edu.au/acmm
by Jennifer Zelenty
This is Pt. 1 of a series of seminars on the use of open source software for atom probe analysis. Pt. 2 will be on interface analysis and happen in a few weeks from now. Pt1: Blender Basics overview of blender Importing atom probe data Visualisation Animation basics
Speaker: David N. Seidman (MSE, NU) "The workshop on Semiconductors, Electronic Materials, Thin Films and Photonic Materials" Tel Aviv University February 22-25, 2015
This video is about atom_probe_PLO, including the entire process from initial sample to final atom probe tips. Watch my webpage (www.peterfelfer.org) for updates on sample preparation and analysis methods for atom probe. If you found this useful, you can find more background information in my paper: A reproducible method for damage-free site specific preparation of atom probe tips by means of FIB lift-out and TEM, P. J. Felfer, T Alam, S.P. Ringer and J.M. Cairney, Microscopy Research and Technique 75 (2012) 484-491. http://dx.doi.org/10.1002/jemt.21081
In this session we briefly went through creating 'fake' atom probe data with known atom distributions. These files can be used to test analysis programs or to be fed into simulations like TAPSim.
Speaker: David N. Seidman (MSE, NU) "The workshop on Semiconductors, Electronic Materials, Thin Films and Photonic Materials" Tel Aviv University February 22-25, 2015
Select/Special Topics in Atomic Physics by Prof. P.C. Deshmukh, Department of Physics, IIT Madras. For more details on NPTEL visit http://nptel.iitm.ac.in