- published: 11 Jun 2013
- views: 37
- author: Wikispeak
28:18
Metrology - Wiki Article
Metrology is the science of measurement. Metrology includes all theoretical and practical ...
published: 11 Jun 2013
author: Wikispeak
Metrology - Wiki Article
Metrology - Wiki Article
Metrology is the science of measurement. Metrology includes all theoretical and practical aspects of measurement. The word comes from Greek μέτρον, "measure"...- published: 11 Jun 2013
- views: 37
- author: Wikispeak
3:38
VIEW Micro-Metrology Benchmark-250
Measuring die thickness, die tilt and loop height. The Benchmark 250 is a compact general-...
published: 24 Jun 2013
author: philharmonicas
VIEW Micro-Metrology Benchmark-250
VIEW Micro-Metrology Benchmark-250
Measuring die thickness, die tilt and loop height. The Benchmark 250 is a compact general-purpose metrology system with all the features and capabilities of ...- published: 24 Jun 2013
- views: 25
- author: philharmonicas
0:59
VIEW Micro-Metrology Stencil Measuring with Continuous Image Capturing Technology
Stencil Measurements by VIEW Micro-Metrology Pinnacle-250 The Pinnacle 250 offers the high...
published: 27 Jun 2012
author: philharmonicas
VIEW Micro-Metrology Stencil Measuring with Continuous Image Capturing Technology
VIEW Micro-Metrology Stencil Measuring with Continuous Image Capturing Technology
Stencil Measurements by VIEW Micro-Metrology Pinnacle-250 The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrology line. I...- published: 27 Jun 2012
- views: 253
- author: philharmonicas
2:05
VIEW Micro-Metrology Pinnacle-250 Video Measuring Machine
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrolog...
published: 24 Dec 2011
author: philharmonicas
VIEW Micro-Metrology Pinnacle-250 Video Measuring Machine
VIEW Micro-Metrology Pinnacle-250 Video Measuring Machine
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrology line. Its high performance and compact footprint make it VIEW Mic...- published: 24 Dec 2011
- views: 178
- author: philharmonicas
1:18
Loop Height Measurement by VIEW Micro-Metrology Pinnacle 250
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrolog...
published: 17 Jan 2012
author: philharmonicas
Loop Height Measurement by VIEW Micro-Metrology Pinnacle 250
Loop Height Measurement by VIEW Micro-Metrology Pinnacle 250
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrology line. Its high performance and compact footprint make it VIEW Mic...- published: 17 Jan 2012
- views: 165
- author: philharmonicas
48:26
T4D #3 - Metrology, Calibration and the Ultimate Multimeter Check
A talk about calibration, measurement and standards terminology. A look at my proof of con...
published: 06 May 2012
author: mjlorton
T4D #3 - Metrology, Calibration and the Ultimate Multimeter Check
T4D #3 - Metrology, Calibration and the Ultimate Multimeter Check
A talk about calibration, measurement and standards terminology. A look at my proof of concept ultimate digital multimeter check. --------------------- Click...- published: 06 May 2012
- views: 3179
- author: mjlorton
25:51
Большой скачок Метрология Битва за эталон (Big jump Metrology Fight for a standard)
...
published: 09 Jun 2013
author: DESHEP HOVMEN
Большой скачок Метрология Битва за эталон (Big jump Metrology Fight for a standard)
Большой скачок Метрология Битва за эталон (Big jump Metrology Fight for a standard)
- published: 09 Jun 2013
- views: 8
- author: DESHEP HOVMEN
1:21
Runningland Metrology & Testing Company 润英蓝地计量检测(上海)有限公司
Runningland Metrology & Testing (Shanghai) Co., Ltd is a certified and accredited independ...
published: 21 Sep 2012
author: runningland
Runningland Metrology & Testing Company 润英蓝地计量检测(上海)有限公司
Runningland Metrology & Testing Company 润英蓝地计量检测(上海)有限公司
Runningland Metrology & Testing (Shanghai) Co., Ltd is a certified and accredited independent third party laboratory for instruments metering, calibration an...- published: 21 Sep 2012
- views: 49
- author: runningland
1:19
FRT - MicroProf 200 TTV MHU - Automated Non-Contact Wafer Metrology Tool
The new FRT MHU is a multi-cassette wafer metrology tool for the fully automated inspectio...
published: 05 Jan 2011
author: integratedmetrology
FRT - MicroProf 200 TTV MHU - Automated Non-Contact Wafer Metrology Tool
FRT - MicroProf 200 TTV MHU - Automated Non-Contact Wafer Metrology Tool
The new FRT MHU is a multi-cassette wafer metrology tool for the fully automated inspection of wafers. The tool accepts wafers from 2" up to 8" in diameter a...- published: 05 Jan 2011
- views: 1595
- author: integratedmetrology
6:46
MOUNTAINS 7 SURFACE IMAGING & METROLOGY SOFTWARE - THE BIG PICTURE
DISCOVER MOUNTAINS 7 - SURFACE IMAGING, ANALYSIS AND METROLOGY SOFTWARE
Discover the late...
published: 20 Sep 2013
MOUNTAINS 7 SURFACE IMAGING & METROLOGY SOFTWARE - THE BIG PICTURE
MOUNTAINS 7 SURFACE IMAGING & METROLOGY SOFTWARE - THE BIG PICTURE
DISCOVER MOUNTAINS 7 - SURFACE IMAGING, ANALYSIS AND METROLOGY SOFTWARE Discover the latest generation of Digital Surf's industry-standard Mountains software for instrument manufacturers, research laboratories and industry. DESIGNED FOR USERS OF ONE OR MORE SURFACE IMAGING AND METROLOGY INSTRUMENTS INCLUDING: - confocal microscopes - optical interferometric microscopes - digital holographic microscopes - focus variation microscopes - structured light systems - contact profilometers - non-contact profilometers - scanning probe microscopes (AFM, MFM, CSAFM, STM, SNOM, etc.) - scanning electron microscopes (including 3D reconstruction) - hyperspectral instruments (Raman, FT-IR, EELS, EDX) - form measuring systems - fringe projection systems - vision measuring machines - coordinate measuring machines MORE INFORMATION http://www.digitalsurf.com- published: 20 Sep 2013
- views: 98
1:59
4.5.4 SF CMM from Hexagon Metrology
The Brown & Sharpe 4.5.4 SF from Hexagon Metrology is a small, flexible coordinate measuri...
published: 23 Jul 2013
4.5.4 SF CMM from Hexagon Metrology
4.5.4 SF CMM from Hexagon Metrology
The Brown & Sharpe 4.5.4 SF from Hexagon Metrology is a small, flexible coordinate measuring system that was specifically designed for harsh factory floor conditions. With integrated thermal compensation, covered ways and specially designed features for shop conditions, the SF is an ideal companion to machine tools in integrated production cells. Easily movable, no shop air required, and can fit through a standard door: you can put the 454 SF anywhere you need precise automated inspection. Learn more at: http://www.hexagonmetrology.us/products/cmms-small-medium/brown-sharpe-global-sf- published: 23 Jul 2013
- views: 13
1:55
Artec Eva 3D Scanner from Exact Metrology
The Eva from Artec is a structured light, full color 3D scanner that is a lightweight, por...
published: 25 Jun 2012
author: ExactMetrology
Artec Eva 3D Scanner from Exact Metrology
Artec Eva 3D Scanner from Exact Metrology
The Eva from Artec is a structured light, full color 3D scanner that is a lightweight, portable solution for a wide range of applications including reverse e...- published: 25 Jun 2012
- views: 5765
- author: ExactMetrology
10:17
John Neal - Michell and Me: How We Cracked Metrology - Megalithomania 2012 preview
http://www.megalithomania.co.uk/johnneal.html. See the Megalithomania interview with John ...
published: 08 Aug 2012
author: MegalithomaniaUK
John Neal - Michell and Me: How We Cracked Metrology - Megalithomania 2012 preview
John Neal - Michell and Me: How We Cracked Metrology - Megalithomania 2012 preview
http://www.megalithomania.co.uk/johnneal.html. See the Megalithomania interview with John at: http://youtu.be/T67XtjfClVM The John Michell Memorial Lecture, ...- published: 08 Aug 2012
- views: 796
- author: MegalithomaniaUK
13:42
Introduction videos of AIST - Metrology and Measurement Science -
AIST is one of the largest public research institutes in Japan. AIST conducts research and...
published: 28 Feb 2012
author: 広報部 産総研
Introduction videos of AIST - Metrology and Measurement Science -
Introduction videos of AIST - Metrology and Measurement Science -
AIST is one of the largest public research institutes in Japan. AIST conducts research and development in a variety of fields including environment, energy, ...- published: 28 Feb 2012
- views: 1501
- author: 広報部 産総研
Youtube results:
1:37
Status Metrology Mitutoyo 710 CMM
Measuring Capacity of 1000mm x 700mm x 600mm Delivered installed with the Industry Standar...
published: 12 Aug 2009
author: statusmetrology
Status Metrology Mitutoyo 710 CMM
Status Metrology Mitutoyo 710 CMM
Measuring Capacity of 1000mm x 700mm x 600mm Delivered installed with the Industry Standard Pc-Dmis 'The Measurement Software for Professionals'- published: 12 Aug 2009
- views: 24562
- author: statusmetrology
3:18
VIEW Micro-Metrology High Performance Video Measuring System
Non-contact optical metrology systems VIEW Micro-Metrology produces high accuracy video co...
published: 27 Mar 2013
author: philharmonicas
VIEW Micro-Metrology High Performance Video Measuring System
VIEW Micro-Metrology High Performance Video Measuring System
Non-contact optical metrology systems VIEW Micro-Metrology produces high accuracy video coordinate measuring systems for process control metrology. VIEW Micr...- published: 27 Mar 2013
- views: 106
- author: philharmonicas
2:08
Non-Contact Metrology of Precision Optics - UltraSurf 5-Axis Non-Contact Profilometer
Non-Contact Metrology of Precision Optics. View the quick setup procedures to prepare for ...
published: 24 Oct 2012
author: OptiPro Systems
Non-Contact Metrology of Precision Optics - UltraSurf 5-Axis Non-Contact Profilometer
Non-Contact Metrology of Precision Optics - UltraSurf 5-Axis Non-Contact Profilometer
Non-Contact Metrology of Precision Optics. View the quick setup procedures to prepare for measurement of an asphere on the UltraSurf, including centering the...- published: 24 Oct 2012
- views: 301
- author: OptiPro Systems
6:51
2012 Prism Award in Test, Measurement, Metrology winner WITech
http://www.photonicsprismaward.com From the award ceremony at Photonics West 2012, WITech ...
published: 22 Mar 2012
author: SPIETV
2012 Prism Award in Test, Measurement, Metrology winner WITech
2012 Prism Award in Test, Measurement, Metrology winner WITech
http://www.photonicsprismaward.com From the award ceremony at Photonics West 2012, WITech accepts the Prism Award in the test, measurement, metrology categor...- published: 22 Mar 2012
- views: 79
- author: SPIETV