nanoHUB-U Fundamentals of AFM L5.2: Dynamic AFM for Electrostatics - Measuring Electrostatic Forces

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• published: 02 Jun 2014
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Table of Contents: 00:09 Lecture 5.2: Measuring Electrostatic Forces II 00:20 From the last lecture 05:56 One pass, Two pass EFM 11:51 Examples 14:29 Examples 18:52 Towards quantitative KPFM 20:29 Effects of tip geometry 23:00 Other issues This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2) Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates. The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.